The measuring instruments of Qmess GmbH

With the use of the most modern measuring machines and procedures, we constantly adapt our equipment to the needs of the market. On this page you can see the measuring devices that are currently used by us. We would be pleased to advise you personally
DEA – Brown Sharpe Global 12.30.10
Touch probe:
SP80
Measuring range X max (mm):
1200 mm
Measuring range Y max (mm)
3000 mm
Measuring range Z max (mm):
1000 mm
Measurement uncertainty:
MPEp: 2,1 μm MPEE = 2,1 +L/300 (μm)
Accreditation scope:
yes
3D – coordinate measuring machines
Brown & Sharpe Chameleon 07.10.07
Touch probe:
SP600; TP20
Measuring range X max (mm):
700 mm
Measuring range Y max (mm)
1000 mm
Measuring range Z max (mm):
700 mm
Measurement uncertainty:
MPEp: 2,1μm MPEE = 2,1 +L/300 (μm)
Accreditation scope:
yes
Hexagon Metrology Global Silver Advantage 09.15.08
Touch probe:
LSP-X1h; TP200; TP20
Measuring range X max (mm):
900 mm
Measuring range Y max (mm)
1500 mm
Measuring range Z max (mm):
800 mm
Measurement uncertainty:
MPEp: 1,4μm MPEE = 1,4 + 3,0 *L/300 (μm)
Accreditation scope:
no
Hexagon Metrology Global Advantage 07.10.07
Touch probe:
LSP-X1h; TP200; TP20
Measuring range X max (mm):
700 mm
Measuring range Y max (mm)
1000 mm
Measuring range Z max (mm):
700 mm
Measurement uncertainty:
MPEp: 1,4μm MPEE = 1,4 + 3,0 *L/300 (μm)
Accreditation scope:
no
Nikon LK Altera 20.10.08
Touch probe:
SP25; TP200; TP20
Measuring range X max (mm):
2000 mm
Measuring range Y max (mm)
1000 mm
Measuring range Z max (mm):
800 mm
Measurement uncertainty:
MPEp: 1,8μm MPEE = 1,8 +L/400 (μm)
Accreditation scope:
no
Hexagon Metrology Tigo SF 05.06.05
Touch probe:
LSP-X1c
Measuring range X max (mm):
500 mm
Measuring range Y max (mm)
600 mm
Measuring range Z max (mm):
500 mm
Measurement uncertainty:
MPEp: 2,2μm MPEE = 2,2 +L/300 (μm)
Accreditation scope:
no
Leitz Reference XI 20.09.07
Touch probe:
LSP-X5
Measuring range X max (mm):
2000 mm
Measuring range Y max (mm)
900 mm
Measuring range Z max (mm):
700 mm
Measurement uncertainty:
MPEp: 1,1μm MPEE = 1,2 +L/350 (μm)
Accreditation scope:
no
Optical measuring systems:
Articulated measuring arm:
Profile measuring device:
Surface testing device:
Height measuring device:
QUINDOS up to Version Q7 PC-DMIS up to Version 2018 R2 Camio 7 Focus 10, CMM Manager Three offline programming stations for PC-DMIS for creating measuring programs using CAD data in the run-up to production COMET plus COMET inspect Cosmos of Mitutoyo (only at the customer's site)
Steinbichler COMET 5 TESA Visio 300 DCC-Multisensor Nikon LK Altera with 3D Laserscanner LC-60 Dx
Nikon MCA II 2.8 with Laserscanner LC-60 Dx taktil
Mitutoyo Contracer CP200
Mitutoyo Surftest SJ400 (On station)
Trimos mini vertikal

Measuring and evaluation software

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Hexagon Metrology Tigo SF 05.06.05
Touch probe:
LSP-X1c
Measuring range X max (mm):
500 mm
Measuring range Y max (mm)
600 mm
Measuring range Z max (mm):
500 mm
Measurement uncertainty:
MPEp: 2,2μm MPEE = 2,2 +L/300 (μm)
Accreditation scope:
no
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